Masayoshi Yamasaki

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Oita-Shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect inspecting apparatus for semiconductor wafer
- Patent number 7,512,501
- Issue date Mar 31, 2009
- Kabushiki Kaisha Toshiba
- Hiroyuki Morinaga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Defect inspecting apparatus, defect inspecting method, semiconducto...
- Publication number 20080052021
- Publication date Feb 28, 2008
- Hiroyuki Morinaga
- G01 - MEASURING TESTING