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IC test system
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Patent number 10,527,669
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Issue date Jan 7, 2020
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HappyJapan, Inc.
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Shouhei Matsumoto
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G01 - MEASURING TESTING
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IC handler
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Patent number 10,473,715
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Issue date Nov 12, 2019
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HappyJapan Inc.
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Shouhei Matsumoto
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G01 - MEASURING TESTING
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IC handler
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Patent number 10,222,413
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Issue date Mar 5, 2019
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HappyJapan Inc.
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Shouhei Matsumoto
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G01 - MEASURING TESTING
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Sputtering system
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Patent number 8,597,479
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Issue date Dec 3, 2013
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Tohoku Seiki Industries, Ltd.
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Keitaro Harada
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C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Solar cell module conveyer line
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Patent number 8,322,509
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Issue date Dec 4, 2012
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Tohoku Seiki Industries, Ltd.
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Masayoshi Yokoo
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B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
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IC handler
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Patent number 6,742,981
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Issue date Jun 1, 2004
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Tohoku Seiki Industries, Ltd.
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Keitaro Harada
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G01 - MEASURING TESTING