Masayoshi Yoshimura

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
- Patent number 7,348,595
- Issue date Mar 25, 2008
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit and testing method for the same
- Patent number 7,197,725
- Issue date Mar 27, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
- Patent number 7,171,600
- Issue date Jan 30, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
- Patent number 7,032,196
- Issue date Apr 18, 2006
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having a device for testing the semiconductor
- Patent number 6,734,549
- Issue date May 11, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of design for testability, method of design for integrated c...
- Patent number 6,708,315
- Issue date Mar 16, 2004
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit and testing method for the same
- Publication number 20070250284
- Publication date Oct 25, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20040197941
- Publication date Oct 7, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20040199840
- Publication date Oct 7, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20040195672
- Publication date Oct 7, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20030025191
- Publication date Feb 6, 2003
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit and testing method for the same
- Publication number 20030021464
- Publication date Jan 30, 2003
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Method of design for testability, method of design for integrated c...
- Publication number 20020129322
- Publication date Sep 12, 2002
- Toshinori Hosokawa
- G01 - MEASURING TESTING

Masayoshi Yoshimura

Person

Patents Grantslast 30 patents

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor integrated circuit and testing method for the same

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor device having a device for testing the semiconductor

Method of design for testability, method of design for integrated c...

Patents Applicationslast 30 patents

Semiconductor integrated circuit and testing method for the same

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor integrated circuit and testing method for the same

Method of design for testability, method of design for integrated c...