Masayuki Abe

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and program for calculating potential, current, and peripher...
- Patent number 10,928,433
- Issue date Feb 23, 2021
- Osaka University
- Masayuki Abe
- G01 - MEASURING TESTING
Information Patent Grant
Scanner and scanning probe microscope
- Patent number 10,884,022
- Issue date Jan 5, 2021
- Osaka University
- Hayato Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing sample in liquid
- Patent number 8,037,739
- Issue date Oct 18, 2011
- Shimadzu Corporation
- Masahiro Ota
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope and interaction force measurement method us...
- Patent number 7,975,316
- Issue date Jul 5, 2011
- Osaka University
- Masahiro Ota
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe position control system and method
- Patent number 7,703,314
- Issue date Apr 27, 2010
- Shimadzu Corporation
- Masayuki Abe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNER AND SCANNING PROBE MICROSCOPE
- Publication number 20200049733
- Publication date Feb 13, 2020
- OSAKA UNIVERSITY
- Hayato YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND PROGRAM FOR CALCULATING POTENTIAL, CURRENT, AND PERIPHER...
- Publication number 20180246154
- Publication date Aug 30, 2018
- OSAKA UNIVERSITY
- Masayuki ABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ANALYZING SAMPLE IN LIQUID
- Publication number 20110048115
- Publication date Mar 3, 2011
- Shimadzu Corporation
- MASAHIRO OTA
- G02 - OPTICS
Information Patent Application
ATOMIC FORCE MICROSCOPE AND INTERACTION FORCE MEASUREMENT METHOD US...
- Publication number 20100071099
- Publication date Mar 18, 2010
- Masahiro Ota
- G01 - MEASURING TESTING
Information Patent Application
Probe position control system and method
- Publication number 20070272005
- Publication date Nov 29, 2007
- Shimadzu Corporation
- Masayuki Abe
- G01 - MEASURING TESTING