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Masayuki Iwasa
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Chiba-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Softening point measuring apparatus and thermal conductivity measur...
Patent number
8,608,373
Issue date
Dec 17, 2013
SII NanoTechnology Inc.
Kazunori Ando
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Softening point measuring apparatus and thermal conductivity measur...
Publication number
20110038392
Publication date
Feb 17, 2011
Kazunori Ando
G01 - MEASURING TESTING