Masayuki Kamata

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Noise evaluation circuit for IC tester
- Patent number 6,696,845
- Issue date Feb 24, 2004
- Ando Electric Co., Ltd. (Japanese)
- Masayuki Kamata
- G01 - MEASURING TESTING
Information Patent Grant
High-speed responsive power supply for measuring equipment
- Patent number 5,917,318
- Issue date Jun 29, 1999
- Ando Electric Co., Ltd.
- Masayuki Kamata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Noise evaluation circuit for IC tester
- Publication number 20030020498
- Publication date Jan 30, 2003
- Ando Electric Co., Ltd. (Japanese)
- Masayuki Kamata
- G01 - MEASURING TESTING