Masayuki KAWABATA

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus, measurement method and computer readable medium
- Patent number 12,055,570
- Issue date Aug 6, 2024
- Advantest Corporation
- Masayuki Kawabata
- G01 - MEASURING TESTING
Information Patent Grant
Sampling apparatus, sampling method and recording medium
- Patent number 8,374,813
- Issue date Feb 12, 2013
- Advantest Corporation
- Takayuki Akita
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and electronic device that tests a device under test
- Patent number 8,274,296
- Issue date Sep 25, 2012
- Advantest Corporation
- Masayuki Kawabata
- G01 - MEASURING TESTING
Information Patent Grant
Sampling apparatus and sampling method
- Patent number 8,271,222
- Issue date Sep 18, 2012
- Advantest Corporation
- Eiji Kanoh
- G01 - MEASURING TESTING
Information Patent Grant
Sampling apparatus, sampling method and recording medium
- Patent number 8,229,706
- Issue date Jul 24, 2012
- Advantest Corporation
- Masayuki Kawabata
- G01 - MEASURING TESTING
Information Patent Grant
Device, test apparatus and test method
- Patent number 8,179,154
- Issue date May 15, 2012
- Advantest Corporation
- Yasuhide Kuramochi
- G01 - MEASURING TESTING
Information Patent Grant
Signal generating apparatus and test apparatus
- Patent number 8,094,053
- Issue date Jan 10, 2012
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
A-D convert apparatus and control method
- Patent number 8,068,047
- Issue date Nov 29, 2011
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal generating apparatus and test apparatus
- Patent number 7,982,520
- Issue date Jul 19, 2011
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal-to-noise ratio measurement for discrete waveform
- Patent number 7,778,785
- Issue date Aug 17, 2010
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Waveform input circuit, waveform observation unit and semiconductor...
- Patent number 7,634,370
- Issue date Dec 15, 2009
- Advantest Corp.
- Masayuki Kawabata
- G01 - MEASURING TESTING
Information Patent Grant
Arbitrary waveform generator, arbitrary waveform generate method, t...
- Patent number 7,348,913
- Issue date Mar 25, 2008
- Advantest Corporation
- Masayuki Kawabata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Waveform generator, waveform shaper, and testing apparatus
- Patent number 7,342,524
- Issue date Mar 11, 2008
- Advantest Corporation
- Masayuki Kawabata
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
A-D converting apparatus, and calibration unit and method therefor
- Patent number 6,452,518
- Issue date Sep 17, 2002
- Advantest Corporation
- Masayuki Kawabata
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Waveform generator and testing device
- Patent number 6,404,371
- Issue date Jun 11, 2002
- Advantest Corporation
- Takeshi Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
A/D or D/A conversion using distribution of differential waveforms...
- Patent number 5,537,113
- Issue date Jul 16, 1996
- Advantest Corp.
- Masayuki Kawabata
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD AND COMPUTER READABLE MEDIUM
- Publication number 20230052937
- Publication date Feb 16, 2023
- Advantest Corporation
- Masayuki KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
DA-CONVERTER AND TEST APPARATUS
- Publication number 20140028326
- Publication date Jan 30, 2014
- Masayuki KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLING APPARATUS AND TEST APPARATUS
- Publication number 20120176143
- Publication date Jul 12, 2012
- Advantest Corporation
- Masayuki KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20120146416
- Publication date Jun 14, 2012
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20120112783
- Publication date May 10, 2012
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND TEST APPARATUS
- Publication number 20110181298
- Publication date Jul 28, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A-D convert apparatus and control method
- Publication number 20110169674
- Publication date Jul 14, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL GENERATING APPARATUS AND TEST APPARATUS
- Publication number 20110148499
- Publication date Jun 23, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL GENERATING APPARATUS AND TEST APPARATUS
- Publication number 20110140938
- Publication date Jun 16, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST APPARATUS AND ELECTRICAL DEVICE
- Publication number 20110109321
- Publication date May 12, 2011
- Advantest Corporation
- Masayuki KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, TEST APPARATUS AND TEST METHOD
- Publication number 20100109674
- Publication date May 6, 2010
- Advantest Corporation
- YASUHIDE KURAMOCHI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLING APPARATUS AND SAMPLING METHOD
- Publication number 20090306917
- Publication date Dec 10, 2009
- Advantest Corporation
- EIJI KANOH
- G01 - MEASURING TESTING
Information Patent Application
SAMPLING APPARATUS, SAMPLING METHOD AND RECORDING MEDIUM
- Publication number 20090306919
- Publication date Dec 10, 2009
- Advantest Corporation
- TAKAYUKI AKITA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLING APPARATUS, SAMPLING METHOD AND RECORDING MEDIUM
- Publication number 20090306936
- Publication date Dec 10, 2009
- Advantest Corporation
- MASAYUKI KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS, TEST APPARATUS, RECORDING MEDIUM, PROGRAM AND...
- Publication number 20090207897
- Publication date Aug 20, 2009
- Advantest Corporation
- TAKAHIRO YAMAGUCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Waveform input circuit, waveform observation unit and semiconductor...
- Publication number 20070268012
- Publication date Nov 22, 2007
- Masayuki Kawabata
- G01 - MEASURING TESTING
Information Patent Application
Waveform generator, waveform shaper, and testing apparatus
- Publication number 20070038405
- Publication date Feb 15, 2007
- Advantest Corporation
- Masayuki Kawabata
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Arbitrary waveform generator, arbitrary waveform generate method, t...
- Publication number 20060273943
- Publication date Dec 7, 2006
- Advantest Corporation
- Masayuki Kawabata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Waveform generator and testing device
- Publication number 20010019313
- Publication date Sep 6, 2001
- Takeshi Takahashi
- G01 - MEASURING TESTING

Masayuki KAWABATA

Person

Patents Grantslast 30 patents

Measurement apparatus, measurement method and computer readable medium

Sampling apparatus, sampling method and recording medium

Test apparatus and electronic device that tests a device under test

Sampling apparatus and sampling method

Sampling apparatus, sampling method and recording medium

Device, test apparatus and test method

Signal generating apparatus and test apparatus

A-D convert apparatus and control method

Signal generating apparatus and test apparatus

Signal-to-noise ratio measurement for discrete waveform

Waveform input circuit, waveform observation unit and semiconductor...

Arbitrary waveform generator, arbitrary waveform generate method, t...

Waveform generator, waveform shaper, and testing apparatus

A-D converting apparatus, and calibration unit and method therefor

Waveform generator and testing device

A/D or D/A conversion using distribution of differential waveforms...

Patents Applicationslast 30 patents

MEASUREMENT APPARATUS, MEASUREMENT METHOD AND COMPUTER READABLE MEDIUM

DA-CONVERTER AND TEST APPARATUS

SAMPLING APPARATUS AND TEST APPARATUS

TEST APPARATUS

TEST APPARATUS

MEASUREMENT APPARATUS AND TEST APPARATUS

A-D convert apparatus and control method

SIGNAL GENERATING APPARATUS AND TEST APPARATUS

SIGNAL GENERATING APPARATUS AND TEST APPARATUS

TEST APPARATUS AND ELECTRICAL DEVICE

DEVICE, TEST APPARATUS AND TEST METHOD

SAMPLING APPARATUS AND SAMPLING METHOD

SAMPLING APPARATUS, SAMPLING METHOD AND RECORDING MEDIUM

SAMPLING APPARATUS, SAMPLING METHOD AND RECORDING MEDIUM

MEASURING APPARATUS, TEST APPARATUS, RECORDING MEDIUM, PROGRAM AND...

Waveform input circuit, waveform observation unit and semiconductor...

Waveform generator, waveform shaper, and testing apparatus

Arbitrary waveform generator, arbitrary waveform generate method, t...

Waveform generator and testing device