Masayuki Konishi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scan test system for semiconductor device
- Patent number 6,865,703
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Takehiko Shimomura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor chip selectively providing a predetermined potential...
- Patent number 6,819,580
- Issue date Nov 16, 2004
- Renesas Technology Corp.
- Masayuki Konishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory access device allowing simultaneous access
- Patent number 6,789,174
- Issue date Sep 7, 2004
- Renesas Technology Corp.
- Masayuki Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor random access memory
- Patent number 6,219,272
- Issue date Apr 17, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Masayuki Konishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Microcomputer having division of timing signals to initialize flash...
- Patent number 6,092,164
- Issue date Jul 18, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Masayuki Konishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Over-erasure preventing device and method
- Patent number 6,081,457
- Issue date Jun 27, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Masayuki Konishi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Microcomputer
- Publication number 20040107388
- Publication date Jun 3, 2004
- RENESAS TECHNOLOGY CORP.
- Masayuki Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor chip selectively providing a predetermined potential...
- Publication number 20040027847
- Publication date Feb 12, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Masayuki Konishi
- G11 - INFORMATION STORAGE
Information Patent Application
Microcomputer capable of identifying instruction executed at abnorm...
- Publication number 20030167424
- Publication date Sep 4, 2003
- Masayuki Konishi
- G01 - MEASURING TESTING
Information Patent Application
Memory access device
- Publication number 20020184454
- Publication date Dec 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Masayuki Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scan test system for semiconductor device
- Publication number 20020144200
- Publication date Oct 3, 2002
- Takehiko Shimomura
- G01 - MEASURING TESTING