Masayuki Masuda

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray inspecting apparatus and X-ray inspecting method
- Patent number 8,391,581
- Issue date Mar 5, 2013
- Omron Corporation
- Masayuki Masuda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus and X-ray inspection method
- Patent number 8,254,519
- Issue date Aug 28, 2012
- Omron Corporation
- Shinji Sugita
- G01 - MEASURING TESTING
Information Patent Grant
X-ray examination method and X-ray examination apparatus
- Patent number 7,680,242
- Issue date Mar 16, 2010
- Omron Corporation
- Masayuki Masuda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray examination apparatus and x-ray examination method using the...
- Patent number 7,522,709
- Issue date Apr 21, 2009
- Omron Corporation
- Masayuki Masuda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Tool attachable to controller
- Patent number 7,117,040
- Issue date Oct 3, 2006
- Omron Corporation
- Masayuki Masuda
- G05 - CONTROLLING REGULATING
Information Patent Grant
System for transmitting data between a device data area and a varia...
- Patent number 6,725,288
- Issue date Apr 20, 2004
- Omron Corporation
- Yoshiyuki Nagao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device interconnected to analog IC driven by high vol...
- Patent number 5,327,000
- Issue date Jul 5, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Kazuaki Miyata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS
- Publication number 20110255660
- Publication date Oct 20, 2011
- Omron Corporation
- Masayuki Masuda
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS
- Publication number 20110249795
- Publication date Oct 13, 2011
- Omron Corporation
- Shinji Sugita
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
- Publication number 20110243299
- Publication date Oct 6, 2011
- Omron Corporation
- Shinji Sugita
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
- Publication number 20110222647
- Publication date Sep 15, 2011
- Omron Corporation
- Shinji Sugita
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTING APPARATUS AND X-RAY INSPECTING METHOD
- Publication number 20100329532
- Publication date Dec 30, 2010
- OMRON CORPORATION
- Masayuki Masuda
- G01 - MEASURING TESTING
Information Patent Application
X-RAY EXAMINATION METHOD AND X-RAY EXAMINATION APPARATUS
- Publication number 20080226023
- Publication date Sep 18, 2008
- OMRON CORPORATION
- Masayuki MASUDA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY EXAMINATION APPARATUS AND X-RAY EXAMINATION METHOD USING THE...
- Publication number 20080226035
- Publication date Sep 18, 2008
- OMRON CORPORATION
- Masayuki Masuda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Apparatus and method for substrate neutralization and glass substra...
- Publication number 20060208201
- Publication date Sep 21, 2006
- Omron Corporation
- Yoshinori Hosokawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Tool attachable to controller
- Publication number 20050157543
- Publication date Jul 21, 2005
- OMRON CORPORATION
- Masayuki Masuda
- G05 - CONTROLLING REGULATING
Information Patent Application
Controllers, tools and systems comprising same
- Publication number 20040139270
- Publication date Jul 15, 2004
- Masayuki Masuda
- G05 - CONTROLLING REGULATING
Information Patent Application
Controllers, extension boards and communication units
- Publication number 20020133240
- Publication date Sep 19, 2002
- Yoshiyuki Nagao
- G06 - COMPUTING CALCULATING COUNTING

Masayuki Masuda

Person

Patents Grantslast 30 patents

X-ray inspecting apparatus and X-ray inspecting method

X-ray inspection apparatus and X-ray inspection method

X-ray examination method and X-ray examination apparatus

X-ray examination apparatus and x-ray examination method using the...

Tool attachable to controller

System for transmitting data between a device data area and a varia...

Semiconductor device interconnected to analog IC driven by high vol...

Patents Applicationslast 30 patents

X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS

X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD

X-RAY INSPECTING APPARATUS AND X-RAY INSPECTING METHOD

X-RAY EXAMINATION METHOD AND X-RAY EXAMINATION APPARATUS

X-RAY EXAMINATION APPARATUS AND X-RAY EXAMINATION METHOD USING THE...

Apparatus and method for substrate neutralization and glass substra...

Tool attachable to controller

Controllers, tools and systems comprising same

Controllers, extension boards and communication units