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Sensor device
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Patent number 8,701,485
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Issue date Apr 22, 2014
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Seiko Epson Corporation
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Masayuki Matsunaga
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G01 - MEASURING TESTING
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Sensor device
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Patent number 8,544,323
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Issue date Oct 1, 2013
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Seiko Epson Corporation
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Masayuki Matsunaga
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G01 - MEASURING TESTING
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Sensor device
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Patent number 8,256,288
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Issue date Sep 4, 2012
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Seiko Epson Corporation
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Masayuki Matsunaga
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G01 - MEASURING TESTING
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Inertial sensor
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Patent number 7,886,596
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Issue date Feb 15, 2011
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Epson Toyocom Corporation
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Masayuki Matsunaga
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H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR