Masayuki Motohama

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Circuit for testing the AC timing of an external input/output termi...
- Patent number 7,565,582
- Issue date Jul 21, 2009
- Panasonic Corporation
- Tomomitsu Masuda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TESTER
- Publication number 20090105970
- Publication date Apr 23, 2009
- Keisuke Kodera
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit
- Publication number 20070257707
- Publication date Nov 8, 2007
- Tomomitsu Masuda
- G01 - MEASURING TESTING