Masayuki Ochi

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Foreign matter inspection apparatus and foreign matter inspection m...
- Patent number 8,625,089
- Issue date Jan 7, 2014
- Hitachi High-Technologies Corporation
- Yoshio Bamba
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,345,233
- Issue date Jan 1, 2013
- Hitachi High-Technologies Corporation
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 8,314,930
- Issue date Nov 20, 2012
- Hitachi High-Technologies Corporation
- Koichi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection apparatus
- Patent number 8,228,496
- Issue date Jul 24, 2012
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method and optical inspection system
- Patent number 8,189,185
- Issue date May 29, 2012
- Hitachi High-Technologies Corporation
- Hideki Soeda
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,102,522
- Issue date Jan 24, 2012
- Hitachi High-Technologies Corporation
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,953,567
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection apparatus and foreign matter inspection m...
- Patent number 7,876,431
- Issue date Jan 25, 2011
- Hitachi High-Technologies Corporation
- Yoshio Bamba
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method and optical inspection system
- Patent number 7,869,025
- Issue date Jan 11, 2011
- Hitachi High-Technologies Corporation
- Hideki Soeda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection apparatus
- Patent number 7,847,927
- Issue date Dec 7, 2010
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 7,847,928
- Issue date Dec 7, 2010
- Hitachi High-Technologies Corporation
- Koichi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,672,799
- Issue date Mar 2, 2010
- Hitachi High-Technologies Corporation
- Kei Shimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign matter inspection apparatus and foreign matter inspection m...
- Patent number 7,589,833
- Issue date Sep 15, 2009
- Hitachi High-Technologies Corporation
- Yoshio Bamba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20130033705
- Publication date Feb 7, 2013
- Hitachi High-Technologies Corporation
- Koichi TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20120140212
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD, AND DEFECT INSPECTION DEVICE
- Publication number 20110141463
- Publication date Jun 16, 2011
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER INSPECTION M...
- Publication number 20110075136
- Publication date Mar 31, 2011
- Hitachi High-Technologies Corporation
- Yoshio BAMBA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION SYSTEM
- Publication number 20110075139
- Publication date Mar 31, 2011
- Hitachi High-Technologies Corporation
- Hideki Soeda
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20110051131
- Publication date Mar 3, 2011
- Hitachi High-Technologies Corporation
- Koichi TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Method and Defect Inspection Apparatus
- Publication number 20100271627
- Publication date Oct 28, 2010
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20100106443
- Publication date Apr 29, 2010
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER INSPECTION M...
- Publication number 20090303470
- Publication date Dec 10, 2009
- Hitachi High-Technologies Corporation
- Yoshio BAMBA
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus and inspection method
- Publication number 20090262339
- Publication date Oct 22, 2009
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION SYSTEM
- Publication number 20090002688
- Publication date Jan 1, 2009
- Hitachi High-Technologies Corporation
- Hideki Soeda
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20080297779
- Publication date Dec 4, 2008
- Koichi TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Method and Defect Inspection Apparatus
- Publication number 20080204736
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
Foreign matter inspection apparatus and foreign matter inspection m...
- Publication number 20080088848
- Publication date Apr 17, 2008
- Hitachi High-Technologies Corporation
- Yoshio BAMBA
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20080059094
- Publication date Mar 6, 2008
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G06 - COMPUTING CALCULATING COUNTING

Masayuki Ochi

Person

Patents Grantslast 30 patents

Foreign matter inspection apparatus and foreign matter inspection m...

Inspection apparatus and inspection method

Inspection device and inspection method

Defect inspection method and defect inspection apparatus

Optical inspection method and optical inspection system

Inspection apparatus and inspection method

Defect inspection apparatus and defect inspection method

Foreign matter inspection apparatus and foreign matter inspection m...

Optical inspection method and optical inspection system

Defect inspection method and defect inspection apparatus

Inspection device and inspection method

Defect inspection apparatus and defect inspection method

Foreign matter inspection apparatus and foreign matter inspection m...

Patents Applicationslast 30 patents

INSPECTION DEVICE AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

DEFECT INSPECTION METHOD, AND DEFECT INSPECTION DEVICE

FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER INSPECTION M...

OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION SYSTEM

INSPECTION DEVICE AND INSPECTION METHOD

Defect Inspection Method and Defect Inspection Apparatus

Defect Inspection Apparatus and Defect Inspection Method

FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER INSPECTION M...

Inspection apparatus and inspection method

OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION SYSTEM

INSPECTION DEVICE AND INSPECTION METHOD

Defect Inspection Method and Defect Inspection Apparatus

Foreign matter inspection apparatus and foreign matter inspection m...

Defect Inspection Apparatus and Defect Inspection Method