Masayuki Suda

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Tilt sensor
- Patent number 10,823,560
- Issue date Nov 3, 2020
- Seiko Instruments Inc.
- Takeshi Uchiyama
- G01 - MEASURING TESTING
Information Patent Grant
Pressure change measurement device, altitude measurement device, an...
- Patent number 10,451,510
- Issue date Oct 22, 2019
- Seiko Instruments Inc.
- Yoko Shinohara
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor
- Patent number 10,094,724
- Issue date Oct 9, 2018
- Seiko Instruments Inc.
- Isao Shimoyama
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever pressure sensor with division portions for dividing leve...
- Patent number 9,995,642
- Issue date Jun 12, 2018
- The University of Tokyo
- Isao Shimoyama
- G01 - MEASURING TESTING
Information Patent Grant
Piezoelectric unit, piezoelectric device, piezoelectric determinati...
- Patent number 9,645,117
- Issue date May 9, 2017
- Seiko Instruments Inc.
- Sachiko Tanabe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
QCM sensor
- Patent number 9,645,115
- Issue date May 9, 2017
- Seiko Instruments Inc.
- Sachiko Tanabe
- G01 - MEASURING TESTING
Information Patent Grant
Electroluminescence element having metal particles dispersed in lig...
- Patent number 7,952,272
- Issue date May 31, 2011
- Seiko Instruments Inc.
- Manabu Oumi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Part fabricating method
- Patent number 6,770,188
- Issue date Aug 3, 2004
- Seiko Instruments Inc.
- Masayuki Suda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Part fabricating apparatus
- Patent number 6,589,402
- Issue date Jul 8, 2003
- Seiko Instruments Inc.
- Reiko Irie
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Pump and method of driving the same
- Patent number 6,481,984
- Issue date Nov 19, 2002
- Seiko Instruments Inc.
- Jun Shinohara
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Part fabricating method and part fabricating apparatus
- Patent number 6,221,228
- Issue date Apr 24, 2001
- Seiko Instruments Inc.
- Reiko Irie
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electrochemical machining method and electrochemical machining equi...
- Patent number 6,059,954
- Issue date May 9, 2000
- Seiko Instruments Inc.
- Masayuki Suda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for performing fine working
- Patent number 5,885,434
- Issue date Mar 23, 1999
- Seiko Instruments Inc.
- Masayuki Suda
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Method of forming and repairing a mask for photolithography
- Patent number 5,686,207
- Issue date Nov 11, 1997
- Seiko Instruments Inc.
- Masayuki Suda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of electrochemical fine processing
- Patent number 5,366,613
- Issue date Nov 22, 1994
- Seiko Instruments Inc.
- Masayuki Suda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electrochemical fine processing apparatus
- Patent number 5,344,539
- Issue date Sep 6, 1994
- Seiko Instruments Inc.
- Masataka Shinogi
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Optical fine processing apparatus
- Patent number 5,288,382
- Issue date Feb 22, 1994
- Seiko Instruments, Inc.
- Masataka Shinogi
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Chemiluminescent detector
- Patent number 5,250,259
- Issue date Oct 5, 1993
- Seiko Instruments Inc.
- Masayuki Suda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TILT SENSOR
- Publication number 20180238685
- Publication date Aug 23, 2018
- SEIKO INSTRUMENTS INC.
- Takeshi UCHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR
- Publication number 20170292877
- Publication date Oct 12, 2017
- THE UNIVERSITY OF TOKYO
- Isao SHIMOYAMA
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE CHANGE MEASUREMENT DEVICE, ALTITUDE MEASUREMENT DEVICE, AN...
- Publication number 20170276563
- Publication date Sep 28, 2017
- SEIKO INSTRUMENTS INC.
- Yoko SHINOHARA
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE CHANGE MEASURING APPARATUS AND PRESSURE CHANGE MEASURING M...
- Publication number 20170160162
- Publication date Jun 8, 2017
- SEIKO INSTRUMENTS INC.
- Yoko SHINOHARA
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR
- Publication number 20160349130
- Publication date Dec 1, 2016
- SEIKO INSTRUMENTS INC.
- Isao SHIMOYAMA
- G01 - MEASURING TESTING
Information Patent Application
PIEZOELECTRIC UNIT, PIEZOELECTRIC DEVICE, PIEZOELECTRIC DETERMINATI...
- Publication number 20150198562
- Publication date Jul 16, 2015
- SEIKO INSTRUMENTS INC.
- Sachiko Tanabe
- G01 - MEASURING TESTING
Information Patent Application
QCM SENSOR
- Publication number 20140165702
- Publication date Jun 19, 2014
- Seiko Instruments Inc.
- Sachiko TANABE
- G01 - MEASURING TESTING
Information Patent Application
Electroluminescence element and display device using the same
- Publication number 20070114523
- Publication date May 24, 2007
- Manabu Oumi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method of manufacturing an organic electronic device
- Publication number 20070048895
- Publication date Mar 1, 2007
- Mitsuru Suginoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Manufacturing method for organic electronic device
- Publication number 20060037934
- Publication date Feb 23, 2006
- Mitsuru Suginoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Part fabricating method
- Publication number 20020092776
- Publication date Jul 18, 2002
- Masayuki Suda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Part fabricating method and part fabricating apparatus
- Publication number 20010002001
- Publication date May 31, 2001
- Reiko Irie
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Masayuki Suda

Person

Patents Grantslast 30 patents

Tilt sensor

Pressure change measurement device, altitude measurement device, an...

Pressure sensor

Cantilever pressure sensor with division portions for dividing leve...

Piezoelectric unit, piezoelectric device, piezoelectric determinati...

QCM sensor

Electroluminescence element having metal particles dispersed in lig...

Part fabricating method

Part fabricating apparatus

Pump and method of driving the same

Part fabricating method and part fabricating apparatus

Electrochemical machining method and electrochemical machining equi...

Method and apparatus for performing fine working

Method of forming and repairing a mask for photolithography

Method of electrochemical fine processing

Electrochemical fine processing apparatus

Optical fine processing apparatus

Chemiluminescent detector

Patents Applicationslast 30 patents

TILT SENSOR

PRESSURE SENSOR

PRESSURE CHANGE MEASUREMENT DEVICE, ALTITUDE MEASUREMENT DEVICE, AN...

PRESSURE CHANGE MEASURING APPARATUS AND PRESSURE CHANGE MEASURING M...

PRESSURE SENSOR

PIEZOELECTRIC UNIT, PIEZOELECTRIC DEVICE, PIEZOELECTRIC DETERMINATI...

QCM SENSOR

Electroluminescence element and display device using the same

Method of manufacturing an organic electronic device

Manufacturing method for organic electronic device

Part fabricating method

Part fabricating method and part fabricating apparatus