Masayuki Yanagisawa

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe resistance measurement method and semiconductor device with p...
- Patent number 9,217,770
- Issue date Dec 22, 2015
- Renesas Electronics Corporation
- Shigetomi Michimata
- G01 - MEASURING TESTING
Information Patent Grant
Probe resistance measurement method and semiconductor device with p...
- Patent number 8,278,935
- Issue date Oct 2, 2012
- Renesas Electronics Corporation
- Shigetomi Michimata
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 7,879,532
- Issue date Feb 1, 2011
- Renesas Electronics Corporation
- Masayuki Yanagisawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device with fuse wires and connection wires
- Patent number 7,361,967
- Issue date Apr 22, 2008
- NEC Electronics Corporation
- Hiroyuki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE RESISTANCE MEASUREMENT METHOD AND SEMICONDUCTOR DEVICE WITH P...
- Publication number 20130001551
- Publication date Jan 3, 2013
- Renesas Electronics Corporation
- Shigetomi MICHIMATA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20110079834
- Publication date Apr 7, 2011
- RENESAS ELECTRONICS CORPORATION
- Masayuki YANAGISAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe resistance measurement method and semiconductor device with p...
- Publication number 20090008641
- Publication date Jan 8, 2009
- NEC Electronics Corporation
- Shigetomi Michimata
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing semiconductor device
- Publication number 20070009836
- Publication date Jan 11, 2007
- NEC Electronics Corporation
- Masayuki Yanagisawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor device
- Publication number 20050181680
- Publication date Aug 18, 2005
- NEC Electronics Corporation
- Hiroyuki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS