Masayuki Yojima

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing semiconductor wafer
- Patent number 6,133,744
- Issue date Oct 17, 2000
- NEC Corporation
- Masayuki Yojima
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring height of object whose surface has...
- Patent number 5,392,110
- Issue date Feb 21, 1995
- NEC Corporation
- Masayuki Yojima
- G01 - MEASURING TESTING