Masazumi Shiochi

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Wiring open detection circuit
- Patent number 10,942,225
- Issue date Mar 9, 2021
- Kabushiki Kaisha Toshiba
- Youichi Satou
- G01 - MEASURING TESTING
Information Patent Grant
Insulated-gate semicustom integrated circuit
- Patent number 4,868,705
- Issue date Sep 19, 1989
- Kabushiki Kaisha Toshiba
- Masazumi Shiochi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WIRING OPEN DETECTION CIRCUIT
- Publication number 20200018788
- Publication date Jan 16, 2020
- Kabushiki Kaisha Toshiba
- Youichi Satou
- G01 - MEASURING TESTING
Information Patent Application
LEVEL SHIFT CIRCUIT
- Publication number 20190245526
- Publication date Aug 8, 2019
- Kabushiki Kaisha Toshiba
- Youichi Satou
- H01 - BASIC ELECTRIC ELEMENTS