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Massimo Scipioni
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Portland, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device with integrated delay chain
Patent number
8,707,236
Issue date
Apr 22, 2014
STMicroelectronics, Inc.
Carlo Alberto Romani
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated circuit burn-in test system and associated methods
Patent number
7,714,599
Issue date
May 11, 2010
STMicroelectronics, Inc.
Riccardo Maggi
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing integrated circuits at operational sp...
Patent number
7,228,476
Issue date
Jun 5, 2007
STMicroelectronics, Inc.
Massimo Scipioni
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit burn-in test system and associated methods
Patent number
7,183,784
Issue date
Feb 27, 2007
STMicroelectronics, Inc.
Riccardo Maggi
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit burn-in test system and associated methods
Patent number
6,861,860
Issue date
Mar 1, 2005
STMicroelectronics, Inc.
Riccardo Maggi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE WITH INTEGRATED DELAY CHAIN
Publication number
20100164585
Publication date
Jul 1, 2010
STMicroelectronics Inc.
Carlo Alberto Romani
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
INTEGRATED CIRCUIT BURN-IN TEST SYSTEM AND ASSOCIATED METHODS
Publication number
20080231306
Publication date
Sep 25, 2008
STMicroelectronics, Inc., State of Incorporation: Delaware
Riccardo Maggi
G01 - MEASURING TESTING
Information
Patent Application
System and method for testing integrated circuits at operational sp...
Publication number
20060117230
Publication date
Jun 1, 2006
STMicroelectronics, Inc.
Massimo Scipioni
G01 - MEASURING TESTING
Information
Patent Application
Integrated circuit burn-in test system and associated methods
Publication number
20050127932
Publication date
Jun 16, 2005
STMicroelectronics, Inc.
Riccardo Maggi
G01 - MEASURING TESTING
Information
Patent Application
Integrated circuit burn-in test system and associated methods
Publication number
20030214316
Publication date
Nov 20, 2003
STMicroelectronics, Inc.
Riccardo Maggi
G01 - MEASURING TESTING