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Masuko Taniguchi
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Kyoto, JP
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Patents Grants
last 30 patents
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Patent Grant
Scan flip-flop circuit, logic macro, scan test circuit, and method...
Patent number
6,920,594
Issue date
Jul 19, 2005
Matsushita Electric Industrial Co., Ltd.
Hiroki Taniguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Scan flip-flop circuit, logic macro, scan test circuit, and method...
Publication number
20020184584
Publication date
Dec 5, 2002
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Hiroki Taniguchi
G01 - MEASURING TESTING