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Masumi Saka
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Sendai-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Method of non-destructive inspection of rear surface flaws and mate...
Patent number
7,123,004
Issue date
Oct 17, 2006
Tohoku Techno Arch Co., Ltd.
Masumi Saka
G01 - MEASURING TESTING
Information
Patent Grant
Noncontact measuring system for electrical conductivity
Patent number
6,879,167
Issue date
Apr 12, 2005
Tohoku Techno Arch Co., Ltd.
Yang Ju
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method of non-destructive inspection of rear surface flaws and mate...
Publication number
20050212514
Publication date
Sep 29, 2005
TOHOKU TECHNO ARCH CO., LTD.
Masumi Saka
G01 - MEASURING TESTING
Information
Patent Application
Noncontact measuring system for electrical conductivity
Publication number
20040100280
Publication date
May 27, 2004
TOHOKU TECHNO ARCH CO., LTD.
Yang Ju
G01 - MEASURING TESTING