Masuyuki Sugiyama

Person

Hino, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mass analysis system, and method for determining performance of mas...
- Patent number 12,106,951
- Issue date Oct 1, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuka Sumigama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector
- Patent number 11,955,327
- Issue date Apr 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid chromatograph mass spectrometer
- Patent number 11,860,142
- Issue date Jan 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Masuyuki Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Substance analyzer and substance analysis method
- Patent number 11,776,800
- Issue date Oct 3, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source
- Patent number 11,749,517
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adhering substance collecting device and inspection system
- Patent number 11,371,915
- Issue date Jun 28, 2022
- Hitachi, Ltd.
- Shun Kumano
- G01 - MEASURING TESTING
Information Patent Grant
Method for preparing standard sample for gas flow type analysis system
- Patent number 10,989,632
- Issue date Apr 27, 2021
- Hitachi, Ltd.
- Yasuaki Takada
- G01 - MEASURING TESTING
Information Patent Grant
Separation column connection device, connection method, and analysi...
- Patent number 10,921,296
- Issue date Feb 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Hideki Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device provided with ion mobility separation part
- Patent number 10,684,256
- Issue date Jun 16, 2020
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Satake
- G01 - MEASURING TESTING
Information Patent Grant
Ion analysis device
- Patent number 10,551,346
- Issue date Feb 4, 2020
- Hitachi High-Technologies Corporation
- Kazushige Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Ionization device
- Patent number 10,466,214
- Issue date Nov 5, 2019
- Hitachi, Ltd.
- Masako Ishimaru
- G02 - OPTICS
Information Patent Grant
Ion analysis device
- Patent number 10,431,445
- Issue date Oct 1, 2019
- Hitachi High-Technologies Corporation
- Kazushige Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide and mass spectrometer using same
- Patent number 10,424,472
- Issue date Sep 24, 2019
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide and mass spectrometer using same
- Patent number 10,204,773
- Issue date Feb 12, 2019
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method
- Patent number 9,601,321
- Issue date Mar 21, 2017
- Hitachi High-Technologies Corporation
- Akihito Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass analyzing method for efficiently ionizin...
- Patent number 9,543,135
- Issue date Jan 10, 2017
- Hitachi High-Technologies Corporation
- Shun Kumano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 9,390,900
- Issue date Jul 12, 2016
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Mass spectrometric system
- Patent number 9,287,105
- Issue date Mar 15, 2016
- Hitachi High-Technologies Corporation
- Yohei Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis device and analysis method
- Patent number 9,214,324
- Issue date Dec 15, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and mass analyzing method
- Patent number 9,184,037
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Shun Kumano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 9,171,704
- Issue date Oct 27, 2015
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole segments aligned in an offset manner in a mass spectrometer
- Patent number 9,123,516
- Issue date Sep 1, 2015
- Hitachi High-Technologies Corporation
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer method and mass spectrometer
- Patent number 9,076,638
- Issue date Jul 7, 2015
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis device and analysis method
- Patent number 9,040,905
- Issue date May 26, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and ion source used therefor
- Patent number 8,941,060
- Issue date Jan 27, 2015
- Hitachi High-Technologies Corporation
- Hiroyuki Satake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,866,070
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 8,835,834
- Issue date Sep 16, 2014
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry
- Patent number 8,835,841
- Issue date Sep 16, 2014
- Hitachi High-Technologies Corporation
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry
- Patent number 8,803,084
- Issue date Aug 12, 2014
- Hitachi High-Technologies Corporation
- Kazushige Nishimura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Mass spectrometry method
- Patent number 8,710,430
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20240361346
- Publication date Oct 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER
- Publication number 20240339312
- Publication date Oct 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Tsugunao TOMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY SYSTEM, PROCESSING DEVICE, AND ANOMALY DETECTION...
- Publication number 20240310338
- Publication date Sep 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Masuyuki Sugiyama
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME
- Publication number 20240177983
- Publication date May 30, 2024
- HITACHI HIGH-TECH COORPORATION
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DEVICE AND METHOD FOR CONTROLLING SAME
- Publication number 20240063010
- Publication date Feb 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuka SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, MASS SPECTROMETER, AND CAPILLARY INSERTION METHOD
- Publication number 20240055249
- Publication date Feb 15, 2024
- Hitachi High-Tech Corporation
- Hideki HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20240038524
- Publication date Feb 1, 2024
- Hitachi, Ltd
- Masuyuki SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING PROTEIN
- Publication number 20230416301
- Publication date Dec 28, 2023
- Hitachi, Ltd
- Masashi Maruyama
- C07 - ORGANIC CHEMISTRY
Information Patent Application
MASS SPECTROMETRY DEVICE CONTROL METHOD, MASS SPECTROMETRY SYSTEM,...
- Publication number 20230170198
- Publication date Jun 1, 2023
- HITACHI HIGH-TECH CORPORATION
- Masuyuki SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, MASS SPECTROMETER, ION SOURCE CONTROL METHOD
- Publication number 20230141083
- Publication date May 11, 2023
- Hitachi High-Tech Corporation
- Hideki HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20230136178
- Publication date May 4, 2023
- Hitachi High-Tech Corporation
- Yuka SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20230056978
- Publication date Feb 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Takuma NISHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE AND MASS SPECTROMETER
- Publication number 20230005730
- Publication date Jan 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD
- Publication number 20220359182
- Publication date Nov 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuaki TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSIS SYSTEM, AND METHOD FOR DETERMINING PERFORMANCE OF MAS...
- Publication number 20220189755
- Publication date Jun 16, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuka SUMIGAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Detector
- Publication number 20220181138
- Publication date Jun 9, 2022
- Hitachi High-Tech Corporation
- Kiyomi YOSHINARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID CHROMATOGRAPH MASS SPECTROMETER
- Publication number 20220050091
- Publication date Feb 17, 2022
- Hitachi High-Tech Corporation
- Masuyuki Sugiyama
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCE
- Publication number 20210358734
- Publication date Nov 18, 2021
- Hitachi High-Tech Corporation
- Hideki Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Adhering Substance Collecting Device and Inspection System
- Publication number 20200319061
- Publication date Oct 8, 2020
- Hitachi, Ltd
- Shun KUMANO
- G01 - MEASURING TESTING
Information Patent Application
ADHERED MATTER INSPECTION METHOD
- Publication number 20200193545
- Publication date Jun 18, 2020
- Hitachi, Ltd
- Shun KUMANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEPARATION COLUMN CONNECTION DEVICE, CONNECTION METHOD, AND ANALYSI...
- Publication number 20200025727
- Publication date Jan 23, 2020
- Hitachi High-Technologies Corporation
- Hideki HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
Ion Analysis Device
- Publication number 20190178841
- Publication date Jun 13, 2019
- Hitachi High-Technologies Corporation
- Kazushige NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
ION GUIDE AND MASS SPECTROMETER USING SAME
- Publication number 20190148122
- Publication date May 16, 2019
- Hitachi High-Technologies Corporation
- Masuyuki SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analysis Device Provided with Ion Mobility Separation Part
- Publication number 20190079051
- Publication date Mar 14, 2019
- Hitachi High-Technologies Corporation
- Hiroyuki SATAKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION DEVICE
- Publication number 20180284083
- Publication date Oct 4, 2018
- Hitachi, Ltd
- Masako ISHIMARU
- G01 - MEASURING TESTING
Information Patent Application
ION ANALYSIS DEVICE
- Publication number 20180286658
- Publication date Oct 4, 2018
- Hitachi High-Technologies Corporation
- Kazushige NISHIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Preparing Standard Sample for Gas Flow Type Analysis System
- Publication number 20180149563
- Publication date May 31, 2018
- Hitachi, Ltd
- Yasuaki TAKADA
- G01 - MEASURING TESTING
Information Patent Application
ION GUIDE AND MASS SPECTROMETER USING SAME
- Publication number 20180025896
- Publication date Jan 25, 2018
- Hitachi High-Technologies Corporation
- Masuyuki SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20150235831
- Publication date Aug 20, 2015
- Hitachi, Ltd
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Method
- Publication number 20150206728
- Publication date Jul 23, 2015
- Hitachi High-Technologies Corporation
- Akihito Kaneko
- H01 - BASIC ELECTRIC ELEMENTS

Masuyuki Sugiyama

Person

Patents Grantslast 30 patents

Mass analysis system, and method for determining performance of mas...

Ion detector

Liquid chromatograph mass spectrometer

Substance analyzer and substance analysis method

Ion source

Adhering substance collecting device and inspection system

Method for preparing standard sample for gas flow type analysis system

Separation column connection device, connection method, and analysi...

Analysis device provided with ion mobility separation part

Ion analysis device

Ionization device

Ion analysis device

Ion guide and mass spectrometer using same

Ion guide and mass spectrometer using same

Mass spectrometer and method

Mass spectrometer and mass analyzing method for efficiently ionizin...

Mass spectrometer

Mass spectrometric system

Analysis device and analysis method

Mass spectrometer and mass analyzing method

Mass spectrometer

Multipole segments aligned in an offset manner in a mass spectrometer

Mass spectrometer method and mass spectrometer

Analysis device and analysis method

Mass spectrometer and ion source used therefor

Mass spectrometer

Mass spectrometer and mass spectrometry method

Mass spectrometer and mass spectrometry

Mass spectrometer and mass spectrometry

Mass spectrometry method

Patents Applicationslast 30 patents

AUTOMATIC ANALYZER

METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER

MASS SPECTROMETRY SYSTEM, PROCESSING DEVICE, AND ANOMALY DETECTION...

MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME

MASS SPECTROMETRY DEVICE AND METHOD FOR CONTROLLING SAME

ION SOURCE, MASS SPECTROMETER, AND CAPILLARY INSERTION METHOD

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

METHOD FOR ANALYZING PROTEIN

MASS SPECTROMETRY DEVICE CONTROL METHOD, MASS SPECTROMETRY SYSTEM,...

ION SOURCE, MASS SPECTROMETER, ION SOURCE CONTROL METHOD

Mass Spectrometer

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

ION SOURCE AND MASS SPECTROMETER

SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD

MASS ANALYSIS SYSTEM, AND METHOD FOR DETERMINING PERFORMANCE OF MAS...

Ion Detector

LIQUID CHROMATOGRAPH MASS SPECTROMETER

ION SOURCE

Adhering Substance Collecting Device and Inspection System

ADHERED MATTER INSPECTION METHOD

SEPARATION COLUMN CONNECTION DEVICE, CONNECTION METHOD, AND ANALYSI...

Ion Analysis Device

ION GUIDE AND MASS SPECTROMETER USING SAME

Analysis Device Provided with Ion Mobility Separation Part

IONIZATION DEVICE

ION ANALYSIS DEVICE

Method for Preparing Standard Sample for Gas Flow Type Analysis System

ION GUIDE AND MASS SPECTROMETER USING SAME

ANALYSIS DEVICE AND ANALYSIS METHOD

Mass Spectrometer and Method