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Mathew L. Gilk
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Lakeville, MN, US
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Patents Grants
last 30 patents
Information
Patent Grant
Test socket
Patent number
7,722,361
Issue date
May 25, 2010
Jose E. Lopez
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device test set and contact used therein
Patent number
7,639,026
Issue date
Dec 29, 2009
Johnstech International Corporation
Dennis B. Shell
G01 - MEASURING TESTING
Information
Patent Grant
Test socket
Patent number
7,445,465
Issue date
Nov 4, 2008
Johnstech International Corporation
Jose E. Lopez
G01 - MEASURING TESTING
Information
Patent Grant
Circuit contact to test apparatus
Patent number
7,338,293
Issue date
Mar 4, 2008
Johnstech International Corporation
Mathew L. Gilk
G01 - MEASURING TESTING
Information
Patent Grant
integrated circuit contact to test apparatus
Patent number
7,059,866
Issue date
Jun 13, 2006
Johnstech International Corporation
Mathew L. Gilk
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEST SOCKET
Publication number
20090053912
Publication date
Feb 26, 2009
Jose E. Lopez
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE TEST SET AND CONTACT USED THEREIN
Publication number
20070236236
Publication date
Oct 11, 2007
Dennis B. Shell
G01 - MEASURING TESTING
Information
Patent Application
Test socket
Publication number
20070032128
Publication date
Feb 8, 2007
Jose E. Lopez
G01 - MEASURING TESTING
Information
Patent Application
SMALL CONTACTOR PIN
Publication number
20060216962
Publication date
Sep 28, 2006
JohnsTech International Corporation
Mathew L. Gilk
G01 - MEASURING TESTING
Information
Patent Application
Small contactor pin
Publication number
20040248448
Publication date
Dec 9, 2004
Mathew L. Gilk
G01 - MEASURING TESTING