Mathias Meyer

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Wroclaw, PL

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Patents Grantslast 30 patents

Information Patent Grant
Technique for processing X-ray diffraction data
- Patent number 10,878,615
- Issue date Dec 29, 2020
- Rigaku Corporation
- Mathias Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray detector and technique of controlling the X-ray detector
- Patent number 10,684,378
- Issue date Jun 16, 2020
- Rigaku Corporation
- Damian Kucharczyk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUE FOR PROCESSING X-RAY DIFFRACTION DATA
- Publication number 20190325635
- Publication date Oct 24, 2019
- Rigaku Corporation
- MATHIAS MEYER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY DETECTOR AND TECHNIQUE OF CONTROLLING THE X-RAY DETECTOR
- Publication number 20190011579
- Publication date Jan 10, 2019
- Rigaku Corporation
- Damian Kucharczyk
- G01 - MEASURING TESTING