Mathias N. M. Muris

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit with interconnect test unit
- Patent number 6,807,505
- Issue date Oct 19, 2004
- Koninklijke Philips Electronics N.V.
- Franciscus G. M. De Jong
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit with interconnect test unit and a method of testing interco...
- Patent number 6,622,108
- Issue date Sep 16, 2003
- Koninklijke Philips Electronics N.V.
- Franciscus G. M. De Jong
- G11 - INFORMATION STORAGE
Information Patent Grant
Connection test method
- Patent number 6,297,643
- Issue date Oct 2, 2001
- U.S. Philips Corporation
- Franciscus G. M. De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing a fixed logic value interconnection between i...
- Patent number 6,119,256
- Issue date Sep 12, 2000
- U.S. Philips Corporation
- Franciscus G. M. De Jong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tester arrangement comprising a connection module for testing, by w...
- Patent number 5,978,945
- Issue date Nov 2, 1999
- U.S. Philips Corporation
- Mathias N. M. Muris
- G01 - MEASURING TESTING
Information Patent Grant
Testable circuit
- Patent number 5,781,559
- Issue date Jul 14, 1998
- U.S. Philips Corporation
- Mathias N. M. Muris
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating test patterns to detect an electric shortcirc...
- Patent number 5,636,229
- Issue date Jun 3, 1997
- U.S. Philips Corporation
- Lars A. R. Eerenstein
- G01 - MEASURING TESTING
Information Patent Grant
Sequential finite-state machine circuit and integrated circuit
- Patent number 5,097,151
- Issue date Mar 17, 1992
- U.S. Philips Corporation
- Lars A. R. Eerenstein
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Circuit with interconnect test unit
- Publication number 20040059535
- Publication date Mar 25, 2004
- Franciscus G.M. De Jong
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION TEST METHOD
- Publication number 20010013781
- Publication date Aug 16, 2001
- FRANCISCUS G.M. DE JONG
- G01 - MEASURING TESTING

Mathias N. M. Muris

Person

Patents Grantslast 30 patents

Circuit with interconnect test unit

Circuit with interconnect test unit and a method of testing interco...

Connection test method

Apparatus for testing a fixed logic value interconnection between i...

Tester arrangement comprising a connection module for testing, by w...

Testable circuit

Method for generating test patterns to detect an electric shortcirc...

Sequential finite-state machine circuit and integrated circuit

Patents Applicationslast 30 patents

Circuit with interconnect test unit

CONNECTION TEST METHOD