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Matias H. Schubert
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Lincoln, NE, US
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last 30 patents
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Patent Grant
Terahertz-infrared ellipsometer system, and method of use
Patent number
8,169,611
Issue date
May 1, 2012
University of Nebraska Board of Regents
Craig M. Herzinger
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Terahertz-infrared ellipsometer system, and method of use
Publication number
20100220313
Publication date
Sep 2, 2010
Craig M. Herzinger
G01 - MEASURING TESTING