Matthew A. Purdy

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Adjusting weighting of a parameter relating to fault detection base...
- Patent number 8,676,538
- Issue date Mar 18, 2014
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for predicting yield parameters based on fault...
- Patent number 7,849,366
- Issue date Dec 7, 2010
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for modifying process selectivities based on p...
- Patent number 7,695,986
- Issue date Apr 13, 2010
- GLOBALFOUNDRIES, INC.
- Matthew A. Purdy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling a film formation process with...
- Patent number 7,473,566
- Issue date Jan 6, 2009
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for selecting wafers for sampling
- Patent number 7,460,968
- Issue date Dec 2, 2008
- Advanced Micro Devices, Inc.
- Richard P. Good
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for scheduling metrology based on a jeopardy c...
- Patent number 7,299,106
- Issue date Nov 20, 2007
- Advanced Micro Devices, Inc.
- Cabe W. Nicksic
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and system for dynamically selecting wafer lots for metrolog...
- Patent number 7,296,103
- Issue date Nov 13, 2007
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for calibrating degradable components using pr...
- Patent number 7,153,709
- Issue date Dec 26, 2006
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for fault classification based on residual vec...
- Patent number 7,100,081
- Issue date Aug 29, 2006
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and system for dynamically adjusting metrology sampling base...
- Patent number 7,076,321
- Issue date Jul 11, 2006
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling cumulative wafer effects
- Patent number 7,069,103
- Issue date Jun 27, 2006
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and system for prioritizing material to clear exception cond...
- Patent number 7,069,098
- Issue date Jun 27, 2006
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for implementing competing control models
- Patent number 7,067,333
- Issue date Jun 27, 2006
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods of controlling optical properties of a capping insulating l...
- Patent number 7,026,170
- Issue date Apr 11, 2006
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fault detection spanning multiple processes
- Patent number 6,991,945
- Issue date Jan 31, 2006
- Advanced Micro Devices, Inc.
- Howard E. Castle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic metrology sampling methods, and system for performing same
- Patent number 6,988,045
- Issue date Jan 17, 2006
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Verifying a fault detection result based on a process control state
- Patent number 6,988,225
- Issue date Jan 17, 2006
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- G05 - CONTROLLING REGULATING
Information Patent Grant
Matching data related to multiple metrology tools
- Patent number 6,978,189
- Issue date Dec 20, 2005
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controlling stepper process parameters based upon optical...
- Patent number 6,967,068
- Issue date Nov 22, 2005
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Prioritizing an application of correction in a multi-input control...
- Patent number 6,912,436
- Issue date Jun 28, 2005
- Advanced Micro Devices, Inc.
- Gary Jones
- G05 - CONTROLLING REGULATING
Information Patent Grant
Updating process controller based upon fault detection analysis
- Patent number 6,871,114
- Issue date Mar 22, 2005
- Eric O. Green
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for integrating dispatch and process control a...
- Patent number 6,790,686
- Issue date Sep 14, 2004
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Methods of controlling VSS implants on memory devices, and system f...
- Patent number 6,790,752
- Issue date Sep 14, 2004
- Advanced Micro Devices, Inc.
- Matthew A. Purdy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determination of a process flow based upon fault detection analysis
- Patent number 6,740,534
- Issue date May 25, 2004
- Advanced Micro Devices, Inc.
- Ernest D. Adams
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Control of two-step gate etch process
- Patent number 6,734,088
- Issue date May 11, 2004
- Advanced Micro Devices, Inc.
- Matthew Purdy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for run-to-run control of trench profiles
- Patent number 6,728,591
- Issue date Apr 27, 2004
- Advanced Micro Devices, Inc.
- James H. Hussey
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for wafer-to-wafer control with partial measur...
- Patent number 6,708,129
- Issue date Mar 16, 2004
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting processing faults using scattero...
- Patent number 6,639,663
- Issue date Oct 28, 2003
- Advanced Micro Devices, Inc.
- Richard J. Markle
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling metal etch processes, and system for accompli...
- Patent number 6,562,635
- Issue date May 13, 2003
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Dry isotropic removal of inorganic anti-reflective coating after po...
- Patent number 6,555,397
- Issue date Apr 29, 2003
- Advanced Micro Devices, Inc.
- Douglas J. Bonser
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR MONITORING A PREDICTED PRODUCT QUALITY DISTRI...
- Publication number 20090276075
- Publication date Nov 5, 2009
- Richard Good
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fault detection through feedback
- Publication number 20060095232
- Publication date May 4, 2006
- Matthew A. Purdy
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR DYNAMICALLY ADJUSTING METROLOGY SAMPLING BASE...
- Publication number 20060074503
- Publication date Apr 6, 2006
- Matthew A. Purdy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR PRIORITIZING MATERIAL TO CLEAR EXCEPTION COND...
- Publication number 20060025879
- Publication date Feb 2, 2006
- Matthew A. Purdy
- G05 - CONTROLLING REGULATING
Information Patent Application
Dynamic metrology sampling methods, and system for performing same
- Publication number 20050033467
- Publication date Feb 10, 2005
- Matthew A. Purdy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Matthew A. Purdy

Person

Patents Grantslast 30 patents

Adjusting weighting of a parameter relating to fault detection base...

Method and apparatus for predicting yield parameters based on fault...

Method and apparatus for modifying process selectivities based on p...

Method and apparatus for controlling a film formation process with...

Method and apparatus for selecting wafers for sampling

Method and apparatus for scheduling metrology based on a jeopardy c...

Method and system for dynamically selecting wafer lots for metrolog...

Method and apparatus for calibrating degradable components using pr...

Method and apparatus for fault classification based on residual vec...

Method and system for dynamically adjusting metrology sampling base...

Controlling cumulative wafer effects

Method and system for prioritizing material to clear exception cond...

Method and apparatus for implementing competing control models

Methods of controlling optical properties of a capping insulating l...

Fault detection spanning multiple processes

Dynamic metrology sampling methods, and system for performing same

Verifying a fault detection result based on a process control state

Matching data related to multiple metrology tools

Method of controlling stepper process parameters based upon optical...

Prioritizing an application of correction in a multi-input control...

Updating process controller based upon fault detection analysis

Method and apparatus for integrating dispatch and process control a...

Methods of controlling VSS implants on memory devices, and system f...

Determination of a process flow based upon fault detection analysis

Control of two-step gate etch process

Method and apparatus for run-to-run control of trench profiles

Method and apparatus for wafer-to-wafer control with partial measur...

Method and apparatus for detecting processing faults using scattero...

Method of controlling metal etch processes, and system for accompli...

Dry isotropic removal of inorganic anti-reflective coating after po...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR MONITORING A PREDICTED PRODUCT QUALITY DISTRI...

Fault detection through feedback

METHOD AND SYSTEM FOR DYNAMICALLY ADJUSTING METROLOGY SAMPLING BASE...

METHOD AND SYSTEM FOR PRIORITIZING MATERIAL TO CLEAR EXCEPTION COND...

Dynamic metrology sampling methods, and system for performing same