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Matthew A. Thompson
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Fishkill, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated circuit with degradation monitoring
Patent number
9,229,051
Issue date
Jan 5, 2016
FREESCALE SEMICONDUCTOR, INC.
Puneet Sharma
G01 - MEASURING TESTING
Information
Patent Grant
Method for analyzing placement context sensitivity of standard cells
Patent number
8,661,393
Issue date
Feb 25, 2014
FREESCALE SEMICONDUCTOR, INC.
Robert E. Boone
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of forming mask with angled struts of reduced height
Patent number
6,221,537
Issue date
Apr 24, 2001
Motorola, Inc.
Matthew Allen Thompson
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of forming a semiconductor device utilizing scalpel mask, an...
Patent number
5,942,760
Issue date
Aug 24, 1999
Motorola Inc.
Matthew Allen Thompson
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Integrated circuit having a dummy structure and method of making
Patent number
5,885,856
Issue date
Mar 23, 1999
Motorola, Inc.
Percy V. Gilbert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for patterning an X-ray master mask
Patent number
5,552,247
Issue date
Sep 3, 1996
Motorola
Whitson G. Waldo
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED CIRCUIT WITH DEGRADATION MONITORING
Publication number
20140132315
Publication date
May 15, 2014
Puneet Sharma
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING PLACEMENT CONTEXT SENSITIVITY OF STANDARD CELLS
Publication number
20140007029
Publication date
Jan 2, 2014
FREESCALE SEMICONDUCTOR, INC.
Robert E. Boone
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR HAVING A CORNER COMPENSATION FEATURE AND METHOD
Publication number
20090108305
Publication date
Apr 30, 2009
Lionel J. Riviere-Cazaux
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY