Matthew B. Nazareth

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El Dorado Hills, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing an integrated device's input/outpu...
- Patent number 7,496,803
- Issue date Feb 24, 2009
- Intel Corporation
- Tanveer R. Khondker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for testing an integrated device's input/outpu...
- Publication number 20070067686
- Publication date Mar 22, 2007
- Tanveer R. Khondker
- G01 - MEASURING TESTING