Matthew D. Moe

Person

Pittsburgh, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
IC with test structures and e-beam pads embedded within a contiguou...
- Patent number 11,107,804
- Issue date Aug 31, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G01 - MEASURING TESTING
Information Patent Grant
IC with test structures and e-beam pads embedded within a contiguou...
- Patent number 11,081,476
- Issue date Aug 3, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC with test structures and e-beam pads embedded within a contiguou...
- Patent number 11,081,477
- Issue date Aug 3, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC with test structures and E-beam pads embedded within a contiguou...
- Patent number 11,075,194
- Issue date Jul 27, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC with test structures and e-beam pads embedded within a contiguou...
- Patent number 11,018,126
- Issue date May 25, 2021
- PDF Solutions, Inc.
- Stephen Lam
- G01 - MEASURING TESTING
Information Patent Grant
IC with test structures and E-beam pads embedded within a contiguou...
- Patent number 10,978,438
- Issue date Apr 13, 2021
- PDF Solutions, Inc.
- Stephen Lam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for grouping logic in an integrated circuit desig...
- Patent number 7,827,516
- Issue date Nov 2, 2010
- PDF Solutions, Inc.
- Matthew D. Moe
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR GROUPING LOGIC IN AN INTEGRATED CIRCUIT DESIG...
- Publication number 20110050281
- Publication date Mar 3, 2011
- Matthew D. Moe
- G06 - COMPUTING CALCULATING COUNTING

Matthew D. Moe

Person

Patents Grantslast 30 patents

IC with test structures and e-beam pads embedded within a contiguou...

IC with test structures and e-beam pads embedded within a contiguou...

IC with test structures and e-beam pads embedded within a contiguou...

IC with test structures and E-beam pads embedded within a contiguou...

IC with test structures and e-beam pads embedded within a contiguou...

IC with test structures and E-beam pads embedded within a contiguou...

Method and system for grouping logic in an integrated circuit desig...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR GROUPING LOGIC IN AN INTEGRATED CIRCUIT DESIG...