Matthew David Conrad

Person

Durham, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Large dimension silicon carbide single crystalline materials with r...
- Patent number 12,125,701
- Issue date Oct 22, 2024
- Wolfspeed, Inc.
- Yuri Khlebnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Large diameter silicon carbide wafers
- Patent number 12,054,850
- Issue date Aug 6, 2024
- Wolfspeed, Inc.
- Yuri Khlebnikov
- C30 - CRYSTAL GROWTH
Information Patent Grant
Nondestructive characterization for crystalline wafers
- Patent number 12,040,355
- Issue date Jul 16, 2024
- Wolfspeed, Inc.
- Robert Tyler Leonard
- C30 - CRYSTAL GROWTH
Information Patent Grant
Alignment for wafer images
- Patent number 11,361,454
- Issue date Jun 14, 2022
- Wolfspeed, Inc.
- Robert Tyler Leonard
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
LARGE DIMENSION SILICON CARBIDE SINGLE CRYSTALLINE MATERIALS WITH R...
- Publication number 20250006491
- Publication date Jan 2, 2025
- Wolfspeed, Inc.
- Yuri Khlebnikov
- C30 - CRYSTAL GROWTH
Information Patent Application
LARGE DIAMETER SILICON CARBIDE WAFERS
- Publication number 20240352622
- Publication date Oct 24, 2024
- Wolfspeed, Inc.
- Yuri Khlebnikov
- C30 - CRYSTAL GROWTH
Information Patent Application
NONDESTRUCTIVE CHARACTERIZATION FOR CRYSTALLINE WAFERS
- Publication number 20240332352
- Publication date Oct 3, 2024
- Wolfspeed, Inc.
- Robert Tyler Leonard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LARGE DIMENSION SILICON CARBIDE SINGLE CRYSTALLINE MATERIALS WITH R...
- Publication number 20220189768
- Publication date Jun 16, 2022
- Cree, Inc.
- Yuri Khlebnikov
- C30 - CRYSTAL GROWTH
Information Patent Application
ALIGNMENT FOR WAFER IMAGES
- Publication number 20210272298
- Publication date Sep 2, 2021
- Cree, Inc.
- Robert Tyler Leonard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LARGE DIAMETER SILICON CARBIDE WAFERS
- Publication number 20210198804
- Publication date Jul 1, 2021
- Cree, Inc.
- Yuri Khlebnikov
- C30 - CRYSTAL GROWTH
Information Patent Application
NONDESTRUCTIVE CHARACTERIZATION FOR CRYSTALLINE WAFERS
- Publication number 20200365685
- Publication date Nov 19, 2020
- Cree, Inc.
- Robert Tyler Leonard
- H01 - BASIC ELECTRIC ELEMENTS

Matthew David Conrad

Person

Patents Grantslast 30 patents

Large dimension silicon carbide single crystalline materials with r...

Large diameter silicon carbide wafers

Nondestructive characterization for crystalline wafers

Alignment for wafer images

Patents Applicationslast 30 patents

LARGE DIMENSION SILICON CARBIDE SINGLE CRYSTALLINE MATERIALS WITH R...

LARGE DIAMETER SILICON CARBIDE WAFERS

NONDESTRUCTIVE CHARACTERIZATION FOR CRYSTALLINE WAFERS

LARGE DIMENSION SILICON CARBIDE SINGLE CRYSTALLINE MATERIALS WITH R...

ALIGNMENT FOR WAFER IMAGES

LARGE DIAMETER SILICON CARBIDE WAFERS

NONDESTRUCTIVE CHARACTERIZATION FOR CRYSTALLINE WAFERS