Matthew E. Seelig

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Rochester, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated optical surface profile measurement system
- Patent number 6,157,450
- Issue date Dec 5, 2000
- Chapman Instruments
- Silvio P. Marchese-Ragona
- G01 - MEASURING TESTING
Information Patent Grant
Wafer holding and orienting fixture for optical profilometry
- Patent number 5,986,753
- Issue date Nov 16, 1999
- Chapman Instruments Inc.
- Matthew E. Seelig
- G01 - MEASURING TESTING