Matthew Hammer

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for stem sample inspection in a charged particle beam instru...
- Patent number RE46350
- Issue date Mar 28, 2017
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
Information Patent Grant
Method for stem sample inspection in a charged particle beam instru...
- Patent number 8,247,768
- Issue date Aug 21, 2012
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method for stem sample inspection in a charged particle beam instru...
- Patent number 8,168,949
- Issue date May 1, 2012
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method for STEM sample inspection in a charged particle beam instru...
- Patent number 7,834,315
- Issue date Nov 16, 2010
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RAPID TEM SAMPLE PREPARATION METHOD WITH BACKSIDE FIB MILLING
- Publication number 20160189929
- Publication date Jun 30, 2016
- OMNIPROBE, INC.
- Matt Hammer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...
- Publication number 20110031396
- Publication date Feb 10, 2011
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...
- Publication number 20110031397
- Publication date Feb 10, 2011
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
GRID HOLDER FOR STEM ANALYSIS IN A CHARGED PARTICLE INSTRUMENT
- Publication number 20100025580
- Publication date Feb 4, 2010
- OMNIPROBE, INC.
- Matthew Hammer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...
- Publication number 20080258056
- Publication date Oct 23, 2008
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING