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Matthew HENDRICKS
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Redwood City, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Compressed test patterns for a field programmable gate array
Patent number
11,193,975
Issue date
Dec 7, 2021
Intel Corportion
Christopher J. Nelson
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
COMPRESSED TEST PATTERNS FOR A FIELD PROGRAMMABLE GATE ARRAY
Publication number
20200003836
Publication date
Jan 2, 2020
Intel Corporation
Christopher J. NELSON
G01 - MEASURING TESTING