Matthew James TURNER

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Somerville, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
High-resolution magnetic field fingerprinting of integrated circuit...
- Patent number 11,519,989
- Issue date Dec 6, 2022
- The Mitre Corporation
- Matthew James Turner
- G01 - MEASURING TESTING
Information Patent Grant
Control and cancellation of spin bath induced dephasing in solid-st...
- Patent number 11,156,674
- Issue date Oct 26, 2021
- President and Fellows of Harvard College
- Connor A. Hart
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated mounting solution for solid-state spin sensors used for...
- Patent number 10,928,320
- Issue date Feb 23, 2021
- President and Fellows of Harvard College
- John Francis Barry
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous vector magnetometry with nitrogen vacancy centers in d...
- Patent number 10,545,200
- Issue date Jan 28, 2020
- President and Fellows of Harvard College
- John Francis Barry
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR QUANTUM SENSING WITH SIGNAL AMPLIFICATION B...
- Publication number 20230081886
- Publication date Mar 16, 2023
- University of Maryland, College Park
- Ronald Walsworth
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION MAGNETIC FIELD FINGERPRINTING OF INTEGRATED CIRCUIT...
- Publication number 20210239779
- Publication date Aug 5, 2021
- President and Fellows of Harvard College
- Matthew James TURNER
- G01 - MEASURING TESTING
Information Patent Application
ORDER OF MAGNITUDE IMPROVEMENT IN T*2 VIA CONTROL AND CANCELLATION...
- Publication number 20210080517
- Publication date Mar 18, 2021
- President and Fellows of Harvard College
- Connor A. HART
- B82 - NANO-TECHNOLOGY
Information Patent Application
SIMULTANEOUS VECTOR MAGNETOMETRY WITH NITROGEN VACANCY CENTERS IN D...
- Publication number 20190178959
- Publication date Jun 13, 2019
- President and Fellows of Harvard College
- John Francis BARRY
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED MOUNTING SOLUTION FOR SOLID-STATE SPIN SENSORS USED FOR...
- Publication number 20180364165
- Publication date Dec 20, 2018
- President and Fellows of Harvard College
- John Francis BARRY
- G01 - MEASURING TESTING