Matthew Klonowski

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated micro actuator and LVDT for high precision position meas...
- Patent number 9,518,814
- Issue date Dec 13, 2016
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated micro actuator and IVDT for high precision position meas...
- Patent number 8,502,525
- Issue date Aug 6, 2013
- Oxford Instruments PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope
- Patent number 8,370,960
- Issue date Feb 5, 2013
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscopy method and apparatus utilizing sample pitch
- Patent number 7,429,732
- Issue date Sep 30, 2008
- Veeco Instruments Inc.
- David A. Kneeburg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Modular Atomic Force Microscope
- Publication number 20170254834
- Publication date Sep 7, 2017
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Integrated Micro Actuator and LVDT for High Precision Position Meas...
- Publication number 20170089733
- Publication date Mar 30, 2017
- OXFORD INSTRUMENTS PLC
- Roger Carlos Proksch
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope
- Publication number 20140223612
- Publication date Aug 7, 2014
- ASYLUM CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Integrated Micro Actuator and LVDT for High Precision Position Meas...
- Publication number 20130314078
- Publication date Nov 28, 2013
- OXFORD INSTRUMENTS AFM INC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Modular atomic force microscope
- Publication number 20100275334
- Publication date Oct 28, 2010
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Integrated micro actuator and lVDT for high precision position meas...
- Publication number 20100213930
- Publication date Aug 26, 2010
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy method and apparatus utilizing sample pitch
- Publication number 20070075243
- Publication date Apr 5, 2007
- David A. Kneeburg
- G01 - MEASURING TESTING