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Matthew L. Adsitt
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Boise, ID, US
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Patents Grants
last 30 patents
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Patent Grant
Memory device testing system and method using compressed fail data
Patent number
7,596,729
Issue date
Sep 29, 2009
Micron Technology, Inc.
Matthew L. Adsitt
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory device testing system and method having real time redundancy...
Patent number
7,454,671
Issue date
Nov 18, 2008
Micron Technology, Inc.
Matthew L. Adsitt
G11 - INFORMATION STORAGE
Information
Patent Grant
System for evaluating and reporting semiconductor test processes
Patent number
6,256,593
Issue date
Jul 3, 2001
Micron Technology Inc.
Tim Damon
G11 - INFORMATION STORAGE
Information
Patent Grant
System for evaluating and reporting semiconductor test processes
Patent number
6,070,131
Issue date
May 30, 2000
Micron Technology, Inc.
Tim Damon
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
Memory device testing system and method using compressed fail data
Publication number
20080005630
Publication date
Jan 3, 2008
Micron Technology, Inc.
Matthew L. Adsitt
G01 - MEASURING TESTING
Information
Patent Application
Memory device testing system and method having real time redundancy...
Publication number
20070255982
Publication date
Nov 1, 2007
Micron Technology, Inc.
Matthew L. Adsitt
G11 - INFORMATION STORAGE
Information
Patent Application
Memory system, method and predecoding circuit operable in different...
Publication number
20050002264
Publication date
Jan 6, 2005
Micron Technology, Inc.
Vinod C. Lakhani
G11 - INFORMATION STORAGE