Matthew Lent

Person

Livermore, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic imaging detector with thermal conduction layer
- Patent number 12,057,515
- Issue date Aug 6, 2024
- Gatan, Inc.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy loss spectrometer using direct detection sensor
- Patent number 10,535,492
- Issue date Jan 14, 2020
- Gatan, Inc.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid energy conversion and processing detector
- Patent number 10,215,865
- Issue date Feb 26, 2019
- Gatan, Inc.
- Alexander Jozef Gubbens
- G01 - MEASURING TESTING
Information Patent Grant
Electron energy loss spectrometer using direct detection sensor
- Patent number 9,966,220
- Issue date May 8, 2018
- Gatan, Inc.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid energy conversion and processing detector
- Patent number 9,696,435
- Issue date Jul 4, 2017
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structural modification using electron beam activated chemical etch
- Patent number 8,052,885
- Issue date Nov 8, 2011
- KLA-Tencor Corporation
- Mehran Naser-Ghodsi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Etch selectivity enhancement in electron beam activated chemical etch
- Patent number 7,879,730
- Issue date Feb 1, 2011
- KLA-Tencor Technologies Corporation
- Mehran Naser-Ghodsi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for e-beam dark imaging with perspective control
- Patent number 7,838,833
- Issue date Nov 23, 2010
- KLA-Tencor Technologies Corporation
- Matthew Lent
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging using electron beam activated chemical etch
- Patent number 7,709,792
- Issue date May 4, 2010
- KLA-Tencor Technologies Corporation
- Mehran Naser-Ghodsi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron beam apparatus and methods of processing data fro...
- Patent number 6,995,369
- Issue date Feb 7, 2006
- KLA-Tencor Technologies Corporation
- Matthew Lent
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for removably adhering a semiconductor substra...
- Patent number 6,722,026
- Issue date Apr 20, 2004
- KLA-Tencor Corporation
- Matthew Harris Lent
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC IMAGING DETECTOR WITH THERMAL CONDUCTION LAYER
- Publication number 20240355943
- Publication date Oct 24, 2024
- GATAN, INC.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC IMAGING DETECTOR WITH THERMAL CONDUCTION LAYER
- Publication number 20210193848
- Publication date Jun 24, 2021
- GATAN, INC.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON ENERGY LOSS SPECTROMETER USING DIRECT DETECTION SENSOR
- Publication number 20180240639
- Publication date Aug 23, 2018
- GATAN, INC.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID ENERGY CONVERSION AND PROCESSING DETECTOR
- Publication number 20170322322
- Publication date Nov 9, 2017
- GATAN, INC.
- Alexander Jozef Gubbens
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON ENERGY LOSS SPECTROMETER USING DIRECT DETECTION SENSOR
- Publication number 20170207059
- Publication date Jul 20, 2017
- GATAN, INC.
- Colin Trevor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID ENERGY CONVERSION AND PROCESSING DETECTOR
- Publication number 20150301196
- Publication date Oct 22, 2015
- GATAN, INC.
- Alexander Jozef Gubbens
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL IMAGING USING ELECTRON BEAM ACTIVATED CHEMICAL ETCH
- Publication number 20070158562
- Publication date Jul 12, 2007
- KLA-Tencor Technologies Corporation
- MEHRAN NASSER-GHODSI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURAL MODIFICATION USING ELECTRON BEAM ACTIVATED CHEMICAL ETCH
- Publication number 20070158303
- Publication date Jul 12, 2007
- KLA-Tencor Technologies Corporation
- MEHRAN NASSER-GHODSI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ETCH SELECTIVITY ENHANCEMENT IN ELECTRON BEAM ACTIVATED CHEMICAL ETCH
- Publication number 20070158304
- Publication date Jul 12, 2007
- KLA-Tencor Technologies Corporation
- Mehran Nasser-Ghodsi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Matthew Lent

Person

Patents Grantslast 30 patents

Electronic imaging detector with thermal conduction layer

Electron energy loss spectrometer using direct detection sensor

Hybrid energy conversion and processing detector

Electron energy loss spectrometer using direct detection sensor

Hybrid energy conversion and processing detector

Structural modification using electron beam activated chemical etch

Etch selectivity enhancement in electron beam activated chemical etch

Apparatus and method for e-beam dark imaging with perspective control

Three-dimensional imaging using electron beam activated chemical etch

Scanning electron beam apparatus and methods of processing data fro...

Apparatus and method for removably adhering a semiconductor substra...

Patents Applicationslast 30 patents

ELECTRONIC IMAGING DETECTOR WITH THERMAL CONDUCTION LAYER

ELECTRONIC IMAGING DETECTOR WITH THERMAL CONDUCTION LAYER

ELECTRON ENERGY LOSS SPECTROMETER USING DIRECT DETECTION SENSOR

HYBRID ENERGY CONVERSION AND PROCESSING DETECTOR

ELECTRON ENERGY LOSS SPECTROMETER USING DIRECT DETECTION SENSOR

HYBRID ENERGY CONVERSION AND PROCESSING DETECTOR

THREE-DIMENSIONAL IMAGING USING ELECTRON BEAM ACTIVATED CHEMICAL ETCH

STRUCTURAL MODIFICATION USING ELECTRON BEAM ACTIVATED CHEMICAL ETCH

ETCH SELECTIVITY ENHANCEMENT IN ELECTRON BEAM ACTIVATED CHEMICAL ETCH