Matthew Marcus

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Photoelectron emission microscope for wafer and reticle inspection
- Patent number 6,979,819
- Issue date Dec 27, 2005
- KLA-Tencor Technologies Corporation
- David Adler
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspection of semiconductor wafers and masks using a...
- Patent number 6,610,980
- Issue date Aug 26, 2003
- KLA-Tencor Corporation
- Lee Veneklasen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Article comprising a multi-port variable capacitor
- Patent number 6,242,989
- Issue date Jun 5, 2001
- Agere Systems Guardian Corp.
- Bradley Paul Barber
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Internal gettering by metal alloy clusters
- Publication number 20100213406
- Publication date Aug 26, 2010
- The Regents of the University of California
- Anthony Buonassisi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Photoelectron emission microscope for wafer and reticle inspection
- Publication number 20030111601
- Publication date Jun 19, 2003
- KLA-Tencor Corporation
- David L. Adler
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for inspection of semiconductor wafers and masks using a...
- Publication number 20020070340
- Publication date Jun 13, 2002
- Lee Veneklasen
- H01 - BASIC ELECTRIC ELEMENTS