Matthew Ryskoski

Person

Kyle, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for modifying process selectivities based on p...
- Patent number 7,695,986
- Issue date Apr 13, 2010
- GLOBALFOUNDRIES, INC.
- Matthew A. Purdy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for comparing device and non-device structures
- Patent number 7,282,374
- Issue date Oct 16, 2007
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for classifying faults based on wafer state da...
- Patent number 7,277,824
- Issue date Oct 2, 2007
- Advanced Micro Devices, Inc.
- Matthew S. Ryskoski
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Advanced process control of thermal oxidation processes, and system...
- Patent number 7,217,578
- Issue date May 15, 2007
- Advanced Micro Devices, Inc.
- Michael J. McBride
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for dynamic adjustment of an active sensor list
- Patent number 7,197,370
- Issue date Mar 27, 2007
- Advanced Micro Devices, Inc.
- Matthew S. Ryskoski
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for scheduling production lots based on lot an...
- Patent number 6,978,187
- Issue date Dec 20, 2005
- Advanced Micro Devices, Inc.
- Matthew S. Ryskoski
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for determining wafer quality profiles
- Patent number 6,868,353
- Issue date Mar 15, 2005
- Advanced Micro Devices, Inc.
- Matthew S. Ryskoski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Batch/lot organization based on quality characteristics
- Patent number 6,799,311
- Issue date Sep 28, 2004
- Advanced Micro Devices, Inc.
- Matthew Ryskoski
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining control actions based on tool...
- Patent number 6,721,616
- Issue date Apr 13, 2004
- Advanced Micro Devices, Inc.
- Matthew S. Ryskoski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a gate insulation layer for a semiconductor devic...
- Patent number 6,617,258
- Issue date Sep 9, 2003
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for planarizing surfaces of semiconductor devi...
- Patent number 6,593,227
- Issue date Jul 15, 2003
- Advanced Micro Devices, Inc.
- Matthew Ryskoski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controlling the deposition of inter-level dielectric laye...
- Patent number 6,582,975
- Issue date Jun 24, 2003
- Advanced Micro Devices, Inc.
- Matthew Ryskoski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for removing a particle from a surface of a se...
- Patent number 6,371,135
- Issue date Apr 16, 2002
- Advanced Micro Devices, Inc.
- Matthew S. Ryskoski
- B08 - CLEANING

Matthew Ryskoski

Person

Patents Grantslast 30 patents

Method and apparatus for modifying process selectivities based on p...

Method and apparatus for comparing device and non-device structures

Method and apparatus for classifying faults based on wafer state da...

Advanced process control of thermal oxidation processes, and system...

Method and apparatus for dynamic adjustment of an active sensor list

Method and apparatus for scheduling production lots based on lot an...

Method and apparatus for determining wafer quality profiles

Batch/lot organization based on quality characteristics

Method and apparatus for determining control actions based on tool...

Method of forming a gate insulation layer for a semiconductor devic...

Method and apparatus for planarizing surfaces of semiconductor devi...

Method of controlling the deposition of inter-level dielectric laye...

Method and apparatus for removing a particle from a surface of a se...