Matthew Steven Hyde

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Wappingers Falls, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Failing address registers for built-in self tests
- Patent number 11,081,202
- Issue date Aug 3, 2021
- International Business Machines Corporation
- Uma Srinivasan
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing multi-port array in integrated circuits
- Patent number 11,069,422
- Issue date Jul 20, 2021
- International Business Machines Corporation
- Matthew Steven Hyde
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test for bit-write enabled memory arrays
- Patent number 10,998,075
- Issue date May 4, 2021
- International Business Machines Corporation
- William Huott
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
FAILING ADDRESS REGISTERS FOR BUILT-IN SELF TESTS
- Publication number 20210098069
- Publication date Apr 1, 2021
- International Business Machines Corporation
- UMA SRINIVASAN
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST FOR BIT-WRITE ENABLED MEMORY ARRAYS
- Publication number 20210074376
- Publication date Mar 11, 2021
- International Business Machines Corporation
- William Huott
- G11 - INFORMATION STORAGE