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Matthew W. Heath
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Hillsboro, OR, US
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Patents Grants
last 30 patents
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Patent Grant
On-die signal timing measurement
Patent number
8,553,503
Issue date
Oct 8, 2013
Intel Corporation
Igor V. Molchanov
G01 - MEASURING TESTING
Information
Patent Grant
Decoupled clocking in testing architecture and method of testing
Patent number
7,917,823
Issue date
Mar 29, 2011
Intel Corporation
David Dehnert
G01 - MEASURING TESTING
Information
Patent Grant
Clock jitter detector
Patent number
7,587,650
Issue date
Sep 8, 2009
Intel Corporation
Matthew W. Heath
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS TO SELECTIVELY EXTEND AN EMBEDDED MICROPROCESS...
Publication number
20100306437
Publication date
Dec 2, 2010
Matthew W. Heath
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Decoupled clocking in testing architecture and method of testing
Publication number
20100169728
Publication date
Jul 1, 2010
David Dehnert
G01 - MEASURING TESTING
Information
Patent Application
ON-DIE SIGNAL TIMING MEASUREMENT
Publication number
20100164476
Publication date
Jul 1, 2010
Igor V. MOLCHANOV
G01 - MEASURING TESTING
Information
Patent Application
Clock jitter detector
Publication number
20080141101
Publication date
Jun 12, 2008
Matthew W. Heath
G06 - COMPUTING CALCULATING COUNTING