Matthew W. Losey

Person

Livermore, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for massively parallel multi-wafer test
- Patent number 9,335,347
- Issue date May 10, 2016
- Advantest Corporation
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Grant
Fine pitch microelectronic contact array and method of making same
- Patent number 8,917,106
- Issue date Dec 23, 2014
- Advantest America, Inc
- Laksmi Namburi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe head for a microelectronic contactor assembly, and methods of...
- Patent number 8,901,950
- Issue date Dec 2, 2014
- Advantest America, Inc.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing semiconductor devices
- Patent number 8,344,748
- Issue date Jan 1, 2013
- Advantest America, Inc
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Microelectronic contactor assembly, structures thereof, and methods...
- Patent number 8,305,101
- Issue date Nov 6, 2012
- Advantest America, Inc.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Grant
Probecard system and method
- Patent number 8,278,956
- Issue date Oct 2, 2012
- Advantest America, Inc
- Matt Losey
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a microelectronic contactor assembly, the probe head...
- Patent number 8,232,818
- Issue date Jul 31, 2012
- Advantest America, Inc.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Grant
Vitreous carbon mask substrate for X-ray lithography
- Patent number 7,608,367
- Issue date Oct 27, 2009
- Sandia Corporation
- Georg Aigeldinger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
FINE PITCH MICROELECTRONIC CONTACT ARRAY AND METHOD OF MAKING SAME
- Publication number 20140232427
- Publication date Aug 21, 2014
- TOUCHDOWN TECHNOLOGIES, INC.
- Laksmi Namburi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST
- Publication number 20140070828
- Publication date Mar 13, 2014
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20120032697
- Publication date Feb 9, 2012
- TOUCHDOWN TECHNOLOGIES, INC.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Application
Probecard System and Method
- Publication number 20110248735
- Publication date Oct 13, 2011
- TOUCHDOWN TECHNOLOGIES, INC.
- Matt Losey
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, THE PROBE HEAD...
- Publication number 20100237889
- Publication date Sep 23, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTRONIC CONTACTOR ASSEMBLY, STRUCTURES THEREOF, AND METHODS...
- Publication number 20100237887
- Publication date Sep 23, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, AND METHODS OF...
- Publication number 20100237888
- Publication date Sep 23, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Yohannes Desta
- G01 - MEASURING TESTING

Matthew W. Losey

Person

Patents Grantslast 30 patents

Method and apparatus for massively parallel multi-wafer test

Fine pitch microelectronic contact array and method of making same

Probe head for a microelectronic contactor assembly, and methods of...

Probe for testing semiconductor devices

Microelectronic contactor assembly, structures thereof, and methods...

Probecard system and method

Probe head for a microelectronic contactor assembly, the probe head...

Vitreous carbon mask substrate for X-ray lithography

Patents Applicationslast 30 patents

FINE PITCH MICROELECTRONIC CONTACT ARRAY AND METHOD OF MAKING SAME

METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST

PROBE FOR TESTING SEMICONDUCTOR DEVICES

Probecard System and Method

PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, THE PROBE HEAD...

MICROELECTRONIC CONTACTOR ASSEMBLY, STRUCTURES THEREOF, AND METHODS...

PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, AND METHODS OF...