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Matthew Wayne Meyer
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Madison, WI, US
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Patents Grants
last 30 patents
Information
Patent Grant
Support structure and method for focus adjustment
Patent number
11,781,909
Issue date
Oct 10, 2023
Thermo Electron Scientific Instruments LLC
Matthew Meyer
G01 - MEASURING TESTING
Information
Patent Grant
Well plate mixing apparatus
Patent number
11,027,284
Issue date
Jun 8, 2021
Thermo Electron Scientific Instruments LLC
Nathaniel S. Safron
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sensor device with carbon nanotube sensor positioned on first and s...
Patent number
10,957,626
Issue date
Mar 23, 2021
Thermo Electron Scientific Instruments LLC
Nathaniel S. Safron
B82 - NANO-TECHNOLOGY
Information
Patent Grant
XPS and Raman sample analysis system and method
Patent number
10,816,476
Issue date
Oct 27, 2020
VG SYSTEMS LIMITED
Timothy Sion Nunney
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SUPPORT STRUCTURE AND METHOD FOR FOCUS ADJUSTMENT
Publication number
20220283026
Publication date
Sep 8, 2022
THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
Matthew Meyer
G01 - MEASURING TESTING
Information
Patent Application
XPS AND RAMAN SAMPLE ANALYSIS SYSTEM AND METHOD
Publication number
20190285548
Publication date
Sep 19, 2019
VG SYSTEMS LIMITED
Timothy Sion NUNNEY
G01 - MEASURING TESTING
Information
Patent Application
Well Plate Mixing Apparatus
Publication number
20190201907
Publication date
Jul 4, 2019
Thermo Electron Scientific Instruments LLC
Nathaniel S. Safron
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Sensor Device with Carbon Nanotube Sensor Positioned on First and S...
Publication number
20190189539
Publication date
Jun 20, 2019
Thermo Electron Scientific Instruments LLC
Nathaniel S. Safron
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Carbon Nanotube-Based Device for Sensing Molecular Interaction
Publication number
20190128829
Publication date
May 2, 2019
Thermo Electron Scientific Instruments LLC
Matthew Wayne Meyer
G01 - MEASURING TESTING