Matthias C. Krantz

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Aptos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Efficient phase defect detection system and method
- Patent number 6,674,522
- Issue date Jan 6, 2004
- KLA-Tencor Technologies Corporation
- Matthias C. Krantz
- G01 - MEASURING TESTING
Information Patent Grant
Conventional and confocal multi-spot scanning optical microscope
- Patent number 6,248,988
- Issue date Jun 19, 2001
- KLA-Tencor Corporation
- Matthias C. Krantz
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Efficient phase defect detection system and method
- Publication number 20020171825
- Publication date Nov 21, 2002
- KLA-TENCOR TECHNOLOGIES, INC.
- Matthias C. Krantz
- G01 - MEASURING TESTING