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Matthias Hampel

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  • Russelsheim, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Vacuum measurement device
    • Patent number 6,734,969
    • Issue date May 11, 2004
    • NanoPhotonics AG
    • Michael Abraham
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Vacuum measurement device
    • Publication number 20020101591
    • Publication date Aug 1, 2002
    • Michael Abraham
    • G01 - MEASURING TESTING