Matthias Langer

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Heubach-Lautern, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for avoiding artefacts during serial block face imaging
- Patent number 9,536,704
- Issue date Jan 3, 2017
- Carl Zeiss Microscopy GmbH
- Matthias Langer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charged particle source
- Patent number 8,519,355
- Issue date Aug 27, 2013
- Carl Zeiss Microscopy GmbH
- Wolfram Buhler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Particle-beam microscope
- Patent number 8,471,203
- Issue date Jun 25, 2013
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR AVOIDING ARTEFACTS DURING SERIAL BLOCK FACE IMAGING
- Publication number 20140092230
- Publication date Apr 3, 2014
- Matthias Langer
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT FOR HOLDING A PARTICLE BEAM APPARATUS
- Publication number 20130153742
- Publication date Jun 20, 2013
- Jürgen POMMERENKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SOURCE
- Publication number 20130087716
- Publication date Apr 11, 2013
- Carl Zeiss Microscopy GmbH
- Wolfram Buhler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
PARTICLE-BEAM MICROSCOPE
- Publication number 20100258719
- Publication date Oct 14, 2010
- CARL ZEISS NTS GMBH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS