Matthias Vaupel

Follow

Person

Gottingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Confocal microscope for determination of a layer thickness and micr...
- Patent number 10,436,571
- Issue date Oct 8, 2019
- Carl Zeiss Microscopy GmbH
- Matthias Vaupel
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining roughness data and/or topography data of sur...
- Patent number 9,097,518
- Issue date Aug 4, 2015
- Carl Zeiss Microscopy GmbH
- Matthias Vaupel
- G01 - MEASURING TESTING
Information Patent Grant
SPR sensor
- Patent number 6,867,865
- Issue date Mar 15, 2005
- Nanofilm Technologie GmbH
- Matthias Vaupel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Confocal microscope for determination of a layer thickness and micr...
- Publication number 20190033054
- Publication date Jan 31, 2019
- CARL ZEISS MICROSCOPY GMBH
- Matthias Vaupel
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING ROUGHNESS DATA AND/OR TOPOGRAPHY DATA OF SUR...
- Publication number 20140285814
- Publication date Sep 25, 2014
- Matthias Vaupel
- G02 - OPTICS
Information Patent Application
Ellipsometry Device Provided With A Resonance Platform
- Publication number 20070216901
- Publication date Sep 20, 2007
- OC OERLIKON BALZERS AG
- Max Wiki
- G01 - MEASURING TESTING