Matthias Zieger

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Riesa, DE

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Patents Grantslast 30 patents

Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 9,983,232
- Issue date May 29, 2018
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 8,841,932
- Issue date Sep 23, 2014
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 7,932,737
- Issue date Apr 26, 2011
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for testing substrates at low temperatures
- Patent number 7,046,025
- Issue date May 16, 2006
- SUSS MicroTec Testsystems GmbH
- Stefan Schneidewind
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20150008948
- Publication date Jan 8, 2015
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20110316574
- Publication date Dec 29, 2011
- Frank-Michael WERNER
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20090179658
- Publication date Jul 16, 2009
- SUSS MicroTec Test Systems GmbH
- Frank-Michael WERNER
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus for testing substrates at low temperatures
- Publication number 20040070415
- Publication date Apr 15, 2004
- Stefan Schneidewind
- G01 - MEASURING TESTING