Matthieu WERQUIN

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Patents Grantslast 30 patents

Information Patent Grant
Imaging device and corresponding imaging method
- Patent number 11,086,009
- Issue date Aug 10, 2021
- MICROWAVE CHARACTERIZATION CENTER
- Florent Clemence
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spatial power combiner
- Patent number 10,326,191
- Issue date Jun 18, 2019
- MICROWAVE CHARACTERIZATION CENTER
- Hadrien Theveneau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shielding attenuation measurement
- Patent number 9,859,999
- Issue date Jan 2, 2018
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Jean-Christophe Joly
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Portable radiometric imaging device and a corresponding imaging method
- Patent number 8,525,113
- Issue date Sep 3, 2013
- Microwave Characterization Center
- Matthieu Werquin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGING DEVICE AND CORRESPONDING IMAGING METHOD
- Publication number 20180074190
- Publication date Mar 15, 2018
- Microwave Characterization Center
- Florent CLEMENCE
- G01 - MEASURING TESTING
Information Patent Application
SPATIAL POWER COMBINER
- Publication number 20170149113
- Publication date May 25, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Hadrien THEVENEAU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHIELDING ATTENUATION MEASUREMENT
- Publication number 20170111129
- Publication date Apr 20, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Jean-Christophe JOLY
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PORTABLE MICROWAVE FREQUENCY IMAGING DEVICE, SYSTEM COMPRISING SUCH...
- Publication number 20160139258
- Publication date May 19, 2016
- MICROWAVE CHARACTERIZATION CENTER
- Nicolas VELLAS
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE RADIOMETRIC IMAGING DEVICE AND A CORRESPONDING IMAGING METHOD
- Publication number 20120038507
- Publication date Feb 16, 2012
- MICROWAVE CHARACTERIZATION CENTER
- Matthieu Werquin
- G01 - MEASURING TESTING