Maureen A. Hanratty

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Process for monitoring the thickness of layers in a microelectronic...
- Patent number 6,605,482
- Issue date Aug 12, 2003
- Texas Instruments Incorporated
- Francis G. Celii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Process for monitoring the thickness of layers in a microelectronic...
- Publication number 20020055197
- Publication date May 9, 2002
- Francis G. Celii
- G01 - MEASURING TESTING