Maurice Henricus Franciscus Janssen

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method for predicting a critical dimension of a feature imaged by a...
- Patent number 7,443,486
- Issue date Oct 28, 2008
- ASML Netherlands B.V.
- Koen Van Ingen Schenau
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and device manufacturing method
- Patent number 7,199,861
- Issue date Apr 3, 2007
- ASML Netherlands B.V.
- Maurice Henricus Franciscus Janssen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Lithography measurements using scatterometry
- Publication number 20060192936
- Publication date Aug 31, 2006
- ASML NETHERLANDS B.V.
- Koen Van Ingen Schenau
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY